Measuring ultra low noise metrological reference with APPH

Measuring ultra low noise metrological reference with Anapico’s APPH signal source analyzers

Very low noise signal sources such as masers have significantly improved their performance in the last few years. It has become increasingly challenging to measure their phase noise with standard equipment and even dedicated phase noise measurement systems. In this technical brief, we show a measurement setup that allows capturing phase noise below the specified noise floor of the measurement instrument by externally down converting a microwave signal to a low IF frequency. Download our technical brief reflecting measurement capabilities of Anapico’s APPH signal source analyzers.

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